Transmission Electron Microscope (TEM)

After Busch’s discovery and development of electron microscopes, companies in different parts of the world developed and produced a prototype of an electron microscope called Transmission Electron Microscopes (TEM). In TEM, the beam of electrons goes through the sample and their interactions are seen on the side of the sample where the beam exits. Then, the image is gathered on a screen. TEMs consist of three major parts:

1. Electron source (electron gun)
2. System of image production
3. System of image recording

TEM has a typical resolution of approximately 2 nm. However, the sample has to be thin enough to transmit electrons so it cannot be used to look at living cells.