Atomic Force Microscope (AFM)

In 1986, Binnig, Berger, and Calvin Quate invented the first derivative of the STM—the Atomic Force Microscope. The AFM is another type of a scanning microscope that scans the surface of the sample. It is different from the STM because it does not measure the current between the tip of the needle and the sample. The AFM has a stylus with a sharp tip that is attached on the end of a long a cantilever. As the stylus scans the sample, the force of the surface pushes or pulls it. The cantilever deflects as a result and a laser beam is used to measure this deflection. This deflection is then turned into a three dimensional topographic image by a computer.

With AFM, a much higher resolution is attained with less sample damage. The AFM can be used on non-conducting samples as well as on liquid samples because there is no current applied on the sample. Thus the AFM can be used to study biological molecules such as cells and proteins.

مواضيع ذات صلة

التحليل الطيفي

الإشعاع الكهرومغناطيسي Electromagnetic Radiation

مكونات الجهاز المستخدم في التحليل الالي

طرق التحليل الآلي Instrumental Methods) )

اطياف الاشعة تحت الحمراء

تشتت الدوران البصري والانكسار المزدوج الدائري

مطياف الفلورة (التألق) Fluorescence spectroscopy

الضوء المستقطب والنشاط الضوئي

الدوران النوعي

البولاريمتر

Electrophoretic Mobility 2

Capillary Electrophoresis 2